Currently with Global Foundries
Working and collaborating with the integration and device manufacturing teams that are with the GF Alliance partners in developing 20nm & 14nm advanced scatterometry & Optical Metrology solutions.
•Design, execute, and analyze experiments to screen and optimize scatterometry/metrology applications for evaluating new equipment that will meet new technology demands (e.g., performance, yield, and reliability) and manufacturing (e.g., process stability, cost of ownership) targets.
•Engage with equipment suppliers to highlight new scatterometry applications requirements and evaluate new equipment solutions.
•Define and maintain optical metrology applications and equipment roadmaps.
•Transfer technology developed with the alliance partners to the GLOBALFOUNDRIES productions fabs.
M.S. Material Science & Metallurgy 1991
NYU Polytechnic Brooklyn, NY.
Thesis: “ Fabrication of NiAl Intermetallic Composite Coatings by Plasma Spraying”
B.S. Chemistry 1982
C.W. Post College Long Island University, Greenvale, NY
August 2011 – present:
MTS Metrology Process Engineer GLOBALFOUNDRIES East Fishkill & Malta, NY
March 2006 – Aug 2011:
Metrology Process Engineer Tokyo Electron Ltd. East Coast Region
Feb. 2004 to March 2006:
Field Applications Manager Ebara Technologies Inc. East Fishkill, NY
Jan. 1993 to Jan. 2004
Staff Field Process Engineer Lam Research Corporation East Fishkill, NY