Prof. Alexander A. Teverovsky
at NASA Goddard Space Flight Ctr
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 January 2003 Paper
Proceedings Volume 4980, (2003) https://doi.org/10.1117/12.472726
KEYWORDS: Actuators, Relays, Resistance, Switching, Temperature metrology, Reliability, Failure analysis, Silicon, Switches, Nickel

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