Alexander is an experienced applied researcher with a Ph.D. in Computer Science. His work record contains over 18 years of R&D experience in companies such as Intel, NICE Systems, NCR, Johnson Controls, etc. During his career, he has specialized and gained both theoretical and practical knowledge in various CS areas such as Software Engineering, Machine/Deep Learning, Data Science, Computer Vision, Robotics, Cloud Computing, etc. Alexander is currently holding the position of Research Scientist at KLA Corporation. His current field of interest is signal response and imaging metrology of semiconductor wafers. In his daily work, Alexander uses data analysis, statistical inference and physics-based ML approach to solve overlay measurement and control problems by reducing the residuals of polynomial wafer models.