Dr. Alexej Grjasnow
at Leibniz-Institut für Photonische Technologien eV
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 July 2007 Paper
Proceedings Volume 6630, 66300J (2007) https://doi.org/10.1117/12.727877
KEYWORDS: Diffraction, Holography, Microscopes, Microscopy, Distance measurement, Distortion, Phase shift keying, Phase retrieval, Charge-coupled devices, Modulation

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