Dr. Ali Hussain
at e2v Technologies plc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 August 2009 Paper
D. Burt, J. Endicott, P. Jerram, P. Pool, D. Morris, A. Hussain, P. Ezra
Proceedings Volume 7439, 743902 (2009) https://doi.org/10.1117/12.825273
KEYWORDS: Silicon, Electrons, Oxides, Dielectrics, Electrodes, Charge-coupled devices, Interfaces, Hydrogen, CCD image sensors, Radiation effects

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