Allyn Jackson
Technical Support and FAE Manager at CyberOptics Corp
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 22 February 2021 Open Access Presentation
Proceedings Volume 11669, 1166901 (2021) https://doi.org/10.1117/12.2595432

Proceedings Article | 18 September 2020 Presentation
Proceedings Volume PV20EX, PV20EX06 (2020) https://doi.org/10.1117/12.2583893

Proceedings Article | 4 September 2015 Paper
Proceedings Volume 9661, 96610Y (2015) https://doi.org/10.1117/12.2209736
KEYWORDS: Reticles, Particles, Sensors, Scanners, Environmental sensing, Photomasks, Atmospheric particles, Semiconducting wafers, Inspection, Contamination control

Proceedings Article | 16 September 2014 Paper
Proceedings Volume 9235, 92350E (2014) https://doi.org/10.1117/12.2066378
KEYWORDS: Reticles, Particles, Sensors, Scanners, Environmental sensing, Atmospheric particles, Semiconducting wafers, Inspection, Photomasks, Contamination control

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top