Dr. Ameng Li
at Shenzhen Academy of Metrology & Quality Inspection
SPIE Involvement:
Publications (14)

Proceedings Article | 8 October 2015 Paper
Proc. SPIE. 9677, AOPC 2015: Optical Test, Measurement, and Equipment
KEYWORDS: Optical imaging, Metrology, Statistical analysis, Imaging systems, Calibration, Inspection, Optical testing, Charge-coupled devices, Analytical research, Standards development

Proceedings Article | 1 May 2014 Paper
Proc. SPIE. 9132, Optical Micro- and Nanometrology V
KEYWORDS: Imaging systems, Calibration, Stereoscopy, Microscopy, Distortion, 3D modeling, Optical metrology, 3D metrology, Systems modeling, 3D image processing

Proceedings Article | 19 December 2013 Paper
Proc. SPIE. 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: 3D acquisition, Imaging systems, Cameras, Calibration, 3D modeling, Image registration, Volume rendering, Light sources and illumination, Systems modeling, 3D image processing

Proceedings Article | 26 September 2013 Paper
Proc. SPIE. 8856, Applications of Digital Image Processing XXXVI
KEYWORDS: Fringe analysis, Phase shifting, Real time imaging, 3D acquisition, Stereoscopy, Fourier transforms, Demodulation, Data acquisition, 3D image processing, Structured light

Proceedings Article | 20 November 2012 Paper
Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II
KEYWORDS: Imaging systems, Speckle, Cameras, Calibration, Computing systems, 3D modeling, Speckle pattern, 3D metrology, Projection systems, Phase shifts

Showing 5 of 14 publications
  • View contact details

Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top