Dr. Amish Desai
Senior Scientist at Tanner Research Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 May 2007 Paper
Proceedings Volume 6556, 65561A (2007) https://doi.org/10.1117/12.722948
KEYWORDS: Lead, Semiconductors, Microelectromechanical systems, Bridges, Explosives, Silicon, Molecular bridges, Manufacturing, Reliability, Safety

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