Dr. Amish Desai
Senior Scientist at Tanner Research Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 May 2007 Paper
Proc. SPIE. 6556, Micro (MEMS) and Nanotechnologies for Defense and Security
KEYWORDS: Lead, Semiconductors, Microelectromechanical systems, Bridges, Explosives, Silicon, Molecular bridges, Manufacturing, Reliability, Safety

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