Prof. Andreas Ostendorf
Full Professor at Ruhr Univ Bochum
SPIE Involvement:
Conference Program Committee | Author | Editor | Student Chapter Advisor
Area of Expertise:
Micromachining , Nanostructuring , Optical scattering , Nanoparticles , Microoptical Resonators , 2-Photon Polymerization
Websites:
Profile Summary

The research activities of Prof. Ostendorf are based on micro- and nanosystems and structures. Using ultrafast lasers opens the window for generating structures beyond the diffraction limit. Also, micro- and nanoparticles are investigated with respect to their optical properties (e.g. scattering, resonances, manipulation by optical tweezers). Exploring the resonances in microparticles can lead to completly new types of sensors. Finally, nanoparticles are generated by laser ablation and their material properties are investigated.
Publications (103)

Proceedings Article | 14 April 2020 Paper
Proc. SPIE. 11349, 3D Printed Optics and Additive Photonic Manufacturing II
KEYWORDS: Optical amplifiers, Two photon polymerization, Mode locking, Image analysis, Semiconductor lasers, Scanning electron microscopy, Polymerization, Photosensitive materials, Pulsed laser operation, Laser systems engineering

Proceedings Article | 1 April 2020 Presentation + Paper
Proc. SPIE. 11354, Optical Sensing and Detection VI
KEYWORDS: Refractive index, Microresonators, Biosensing, Two photon polymerization, Sensors, Sensing systems, Optical microcavities

Proceedings Article | 2 March 2020 Presentation + Paper
Proc. SPIE. 11273, High-Power Laser Materials Processing: Applications, Diagnostics, and Systems IX
KEYWORDS: Laser energy, Surface roughness, Laser ablation, Shape memory alloys

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Gold, Refractive index, Two photon polymerization, Silver, Polymerization, Photosensitive materials, Multiphoton lithography, Absorption

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Aberration correction, Holograms, Holography, Three dimensional sensing, Digital holography, Interferometers, Calibration, Microscopy, Particles, Phase retrieval, Reconstruction algorithms

Showing 5 of 103 publications
Proceedings Volume Editor (15)

SPIE Conference Volume | 2 July 2018

SPIE Conference Volume | 22 June 2016

SPIE Conference Volume | 28 May 2014

SPIE Conference Volume | 21 May 2012

SPIE Conference Volume | 10 May 2010

Showing 5 of 15 publications
Conference Committee Involvement (40)
Optics and Photonics for Advanced Dimensional Metrology
6 April 2020 | Online Only, France
Advanced Manufacturing Technologies for Micro- and Nanosystems in Security and Defence II
9 September 2019 | Strasbourg, France
Advanced Manufacturing Technologies for Micro- and Nanosystems in Security and Defence
10 September 2018 | Berlin, Germany
Optical Micro- and Nanometrology
25 April 2018 | Strasbourg, France
Nanophotonics
22 April 2018 | Strasbourg, France
Showing 5 of 40 Conference Committees
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