Dr. Andrei Brunfeld Profile

Dr. Andrei Brunfeld

Senior Staff Scientist at Seagate Technology LLC

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Publications (6)

Proceedings Article | 11 August 2008 Paper

Micro Fabry-Perot sensor for surface measurement

Andrei Brunfeld, Gregory Toker, Morey Roscrow, Bryan Clark

Proceedings Volume 7063, 70630U (2008) https://doi.org/10.1117/12.798135

KEYWORDS: Inspection, Interferometry, Scattering, Surface finishing, Fabry–Perot interferometers, Resonators, Interferometers, Head, Mirrors, Laser scattering

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Proceedings Article | 30 May 2003 Paper

Vector simulations of dark beam interaction with nanoscale surface features

Alexander Tavrov, Norbert Kerwien, Reinhard Berger, Hans Tiziani, Michael Totzeck, Boris Spektor, Josef Shamir, Gregory Toker, Andrei Brunfeld

Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.500588

KEYWORDS: Polarization, Microscopes, Signal detection, Microscopy, Photodetectors, Interference (communication), Diffraction, Signal to noise ratio, Objectives, Inspection

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Proceedings Article | 20 June 2002 Paper

In-line optical surface roughness determination by laser scanning

Gregory Toker, Andrei Brunfeld, Joseph Shamir, Boris Spektor, Evan Cromwell, Johann Adam

Proceedings Volume 4777, (2002) https://doi.org/10.1117/12.472232

KEYWORDS: Surface roughness, Atomic force microscopy, Sensors, Wavefronts, Inspection, Fourier transforms, Laser scanners, Surface finishing, Optical testing, Statistical analysis

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Proceedings Article | 20 June 2002 Paper

High-resolution surface feature evaluation using multiwavelength optical transforms

Boris Spektor, Gregory Toker, Joseph Shamir, Michael Friedman, Andrei Brunfeld

Proceedings Volume 4777, (2002) https://doi.org/10.1117/12.472234

KEYWORDS: Signal detection, Transform theory, Sensors, Diffraction, Optical testing, Reconstruction algorithms, Near field optics, Interferometry, Reflectivity, Gaussian beams

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Proceedings Article | 11 March 1996 Paper

Defect analysis with black beam interferometry

Gregory Toker, Andrei Brunfeld

Proceedings Volume 2651, (1996) https://doi.org/10.1117/12.235346

KEYWORDS: Sensors, Signal detection, Interferometry, Inspection, Glasses, Calibration, Beam analyzers, Defect detection, Interferometers, LCDs

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Showing 5 of 6 publications

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