Andrew Walowitz
at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 2 March 2020 Paper
Anna Vaskuri, Michelle Stephens, Nathan Tomlin, Christopher Yung, Andrew Walowitz, Cameron Straatsma, David Harber, John Lehman
Proceedings Volume 11269, 112690L (2020) https://doi.org/10.1117/12.2545254
KEYWORDS: Sensors, Bolometers, Radiometry, Calibration, Carbon nanotubes, Reflectivity, Finite element methods, Transmittance, Microfabrication, Laser metrology, Thermal analysis, Photonic microstructures, Photonic nanostructures

Proceedings Article | 7 September 2018 Presentation + Paper
Alexandra Artusio-Glimpse, Ivan Ryger, Paul Williams, Kyle Rogers, Daniel Rahn, Andrew Walowitz, John Lehman
Proceedings Volume 10723, 107230V (2018) https://doi.org/10.1117/12.2324334
KEYWORDS: Mirrors, Silicon, Semiconducting wafers, Electrodes, Reflectivity, Power meters, Plasma enhanced chemical vapor deposition, Coating, Finite element methods, Silica

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