André Fischer
at TU Dresden
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 22 March 2013 Paper
Proceedings Volume 8665, 86650D (2013) https://doi.org/10.1117/12.2004348
KEYWORDS: Distortion, Vignetting, Cameras, Optical aberrations, Sensors, Geometrical optics, Instrument modeling, Forensic science, Databases, Image segmentation

Proceedings Article | 24 March 2009 Paper
Laurent Karsenti, Arno Wehner, Andreas Fischer, Uwe Seifert, Jens Goeckeritz, Mark Geshel, Dieter Gscheidlen, Avishai Bartov
Proceedings Volume 7272, 727239 (2009) https://doi.org/10.1117/12.814095
KEYWORDS: Inspection, Semiconducting wafers, Finite element methods, SRAF, Defect inspection, Optical proximity correction, Design for manufacturing, Metrology, Lithography, Modulation

Proceedings Article | 4 March 2008 Paper
Andreas Fischer, Uwe Seifert, Arno Wehner, Laurent Karsenti, Mark Geshel, Amiad Conley, Dieter Gscheidlen, Avishai Bartov
Proceedings Volume 6925, 69251S (2008) https://doi.org/10.1117/12.775713
KEYWORDS: Semiconducting wafers, Computer aided design, Scanning electron microscopy, Metrology, Defect inspection, Optical transfer functions, Photomasks, Optical proximity correction, Finite element methods, Lithography

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