Ann M. Dummer
Graduate Research Assistant at Colorado State Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 29 September 2004 Paper
Proceedings Volume 5527, (2004) https://doi.org/10.1117/12.559903
KEYWORDS: Laser damage threshold, Multilayers, Ion beams, Aluminum, Oxides, Tantalum, Reflectivity, Sputter deposition, Thin films, Laser systems engineering

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