Dr. Anne-Sophie Morlens Profile

Dr. Anne-Sophie Morlens

at Ecole Nationale Supérieure de Techniques Avancées

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Author

Publications (6)

Proceedings Article | 12 October 2007 Paper

Characterization of an OFI seeded soft x-ray laser

Ph. Zeitoun, S. Sebban, J. Goddet, F. Bridou, F. Burgy, B. Cros, D. Douillet, J. Gautier, O. Guillbaud, G. Jamelot, D. Joyeux, S. Kazamias, A. Klisnick, G. Maynard, A. Morlens, D. Phalippou, T. Lefrou, D. Ros, J. Rousseau

Proceedings Volume 6702, 670209 (2007) https://doi.org/10.1117/12.731002

KEYWORDS: X-ray lasers, Wavefronts, Spatial coherence, Spectroscopy, Visibility, Mirrors, Amplifiers, X-rays, Interferometers, Spatial filters

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Proceedings Article | 1 October 2007 Paper

High order harmonics wavefront measurement and optimization

J. Gautier, A. Morlens, P. Zeitoun, E. Papalarazou, G. Rey, C. Valentin, J. Goddet, S. Sebban, Guillaume Dovillaire, Xavier Levecq, Samuel Bucourt

Proceedings Volume 6704, 670403 (2007) https://doi.org/10.1117/12.732339

KEYWORDS: Wavefronts, Sensors, Calibration, X-rays, Monochromatic aberrations, Infrared radiation, Extreme ultraviolet, High harmonic generation, Argon, X-ray optics

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Proceedings Article | 20 September 2007 Paper

XUV optics for attosecond applications

J. Gautier, A. S. Morlens, P. Zeitoun, G. Rey, C. Valentin, E. Papalarazou, J. P. Goddet, S. Sebban, F. Delmotte, M. F. Ravet, F. Bridou

Proceedings Volume 6705, 67050C (2007) https://doi.org/10.1117/12.732424

KEYWORDS: Mirrors, Reflectivity, Holography, Holograms, Multilayers, Silicon, Extreme ultraviolet, Microscopy, Digital holography, X-rays

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Proceedings Article | 5 October 2005 Paper

X-UV chirped mirror fabrication for phase control of attosecond pulses

Anne-Sophie Morlens, Marie-Françoise Ravet, Vincent Laude, Rodrigo López-Martens, Marc Roulliay, Arnaud Jérome, Franck Delmotte, Françoise Bridou, Sophie Kazamias, Philippe Balcou, Philippe Zeitoun

Proceedings Volume 5963, 59630W (2005) https://doi.org/10.1117/12.625097

KEYWORDS: Mirrors, Reflectivity, Silicon, Molybdenum, Multilayers, Extreme ultraviolet, Calibration, Reflectometry, Neon, Control systems

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Proceedings Article | 6 May 2005 Paper

EUV microexposures at the ALS using the 0.3-NA MET projection optics

Patrick Naulleau, Kenneth Goldberg, Erik Anderson, Jason Cain, Paul Denham, Brian Hoef, Keith Jackson, Anne-Sophie Morlens, Seno Rekawa, Kim Dean

Proceedings Volume 5751, (2005) https://doi.org/10.1117/12.600388

KEYWORDS: Printing, Fiber optic illuminators, Line edge roughness, Extreme ultraviolet, Semiconducting wafers, Photomasks, Extreme ultraviolet lithography, Reticles, Projection systems, Wafer-level optics

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Proceedings Article | 19 December 2003 Paper

New techniques for the measurement of x-ray beam or x-ray optics quality

Philippe Zeitoun, Philippe Balcou, Samuel Bucourt, Djamel Benredjem, Franck Delmotte, Guillaume Dovillaire, Denis Douillet, James Dunn, G. Faivre, Marta Fajardo, Kenneth Goldberg, Mourad Idir, Sebastien Hubert, Jim Hunter, Sylvie Jacquemot, Sophie Kazamias, Sebastien le Pape, Xavier Levecq, Ciaran Lewis, Remy Marmoret, Pascal Mercere, A. Morlens, Patrick Naulleau, Christian Remond, Jorge Rocca, Stephane Sebban, Raymond Smith, Marie-Francoise Ravet, Philippe Troussel, Constance Valentin, Laurent Vanbostal

Proceedings Volume 5197, (2003) https://doi.org/10.1117/12.508183

KEYWORDS: Wavefronts, X-ray lasers, Wavefront sensors, Extreme ultraviolet, Plasma, Mirrors, Interferometers, Picosecond phenomena, Michelson interferometers, X-ray optics

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Showing 5 of 6 publications

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