Dr. Annelie Schiller
at Fraunhofer IPM
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 15 August 2023 Presentation + Paper
Patrick Laux, Annelie Schiller, Alexander Bertz, Daniel Carl, Stephan Reichelt
Proceedings Volume 12618, 126181F (2023) https://doi.org/10.1117/12.2672865
KEYWORDS: Speckle, Surface roughness, Tolerancing, Speckle pattern, Sensors, Holography, Polarized light, Spatial resolution, Speckle metrology

Proceedings Article | 15 August 2023 Paper
Tobias Seyler, Markus Fratz, Annelie Schiller, Alexander Bertz, Daniel Carl, Tobias Schmitt-Manderbach, Markus Langer
Proceedings Volume 12618, 126181U (2023) https://doi.org/10.1117/12.2673585
KEYWORDS: Digital holography, Holography, Sensors, Point clouds, Manufacturing, 3D metrology, Computer aided design, Mirror surfaces, Metrology

Proceedings Article | 20 May 2022 Poster + Paper
Proceedings Volume 12137, 121370R (2022) https://doi.org/10.1117/12.2621641
KEYWORDS: Digital holography, Sensors, Tunable lasers, Speckle, Semiconductor lasers, Photography, Data acquisition, Cameras, Holography

Proceedings Article | 20 May 2022 Poster + Paper
G. Laskin, J. Heider, R. Schnetzler, M. Fratz, A. Schiller, A. Bertz, M. Laufenberg, D. Carl
Proceedings Volume 12136, 121360X (2022) https://doi.org/10.1117/12.2619698
KEYWORDS: Sensors, Switching, Magnetism, Interferometry, Digital holography, Speckle pattern, Phase shifting, Cameras, Shape analysis, Actuators

Proceedings Article | 20 June 2021 Poster + Presentation + Paper
Annelie Schiller, Tobias Beckmann, Markus Fratz, Alexander Bertz, Daniel Carl
Proceedings Volume 11782, 117821P (2021) https://doi.org/10.1117/12.2591936
KEYWORDS: Digital holography, Motion measurement, Cameras, Speckle, Semiconductor lasers, Range imaging, Precision measurement, Phase shifting, Interferometry, Inspection

Showing 5 of 8 publications
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