Dr. Anthony J. Gleeson Profile

Dr. Anthony J. Gleeson

at Daresbury Lab

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 14 May 2015 Paper

The use of short and wide x-ray pulses for time-of-flight x-ray Compton Scatter Imaging in cargo security

Nick Calvert, Marta Betcke, John Cresswell, Alick Deacon, Anthony Gleeson, Daniel Judson, Peter Mason, Peter McIntosh, Edward Morton, Paul Nolan, James Ollier, Mark Procter, Robert Speller

Proceedings Volume 9456, 945604 (2015) https://doi.org/10.1117/12.2176832

KEYWORDS: Sensors, Photons, X-rays, X-ray sources, Signal detection, X-ray imaging, Data acquisition, Deconvolution, Lead, X-ray detectors

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Proceedings Article | 18 May 2009 Paper

Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser

J. Cihelka, L. Juha, J. Chalupský, F. Rosmej, O. Renner, K. Saksl, V. Hájková, L. Vyšin, E. Galtier, R. Schott, A. Khorsand, D. Riley, T. Dzelzainis, A. Nelson, R. Lee, P. Heimann, B. Nagler, S. Vinko, J. Wark, T. Whitcher, S. Toleikis, T. Tschentscher, R. Faustlin, H. Wabnitz, S. Bajt, H. Chapman, J. Krzywinski, R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, S. Hau-Riege, R. London, J. Kuba, N. Stojanovic, K. Sokolowski-Tinten, A. Gleeson, M. Störmer, J. Andreasson, J. Hajdu, N. Timneanu

Proceedings Volume 7361, 73610P (2009) https://doi.org/10.1117/12.822766

KEYWORDS: Aluminum, Plasma, Silicon, Ions, Free electron lasers, Copper, Chemical species, Spectroscopy, Mirrors, Emission spectroscopy

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Proceedings Article | 20 September 2007 Paper

Recent developments on the Daresbury Laboratory long trace profiler

A. Gleeson

Proceedings Volume 6704, 67040F (2007) https://doi.org/10.1117/12.733762

KEYWORDS: Sensors, Metrology, Mirrors, Charge-coupled devices, Ocean optics, Temperature metrology, CCD image sensors, Aluminum, Control systems, Head

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Proceedings Article | 18 May 2007 Paper

Optics challenges in 4GLS: radiation damage

M. Bowler, M. Roper, A. Gleeson, F. Quinn, B. Fell, N. Thompson, M. MacDonald

Proceedings Volume 6586, 658602 (2007) https://doi.org/10.1117/12.723338

KEYWORDS: Mirrors, Reflectivity, Free electron lasers, Aluminum, Silicon carbide, Silicon, Polarization, Laser damage threshold, Terahertz radiation, Finite element methods

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