Prof. Anthony Yen
Senior Executive, ASML
SPIE Involvement:
Author
Area of Expertise:
Optical Physics , Nanopatterning , EUV Lithography , Semiconductor Technology
Profile Summary

Anthony (Tony) Yen is Vice President and Head of the Technology Development Center at ASML, leading a global organization to work on identifying mid- and long-term technological directions in semiconductors and accompanying patterning solutions in close collaboration with other organizations within ASML, imec, and universities. He also teaches as a Professor at National Tsing Hua University. Tony received his BSEE degree from Purdue University and his SM, EE, PhD, and MBA degrees from MIT. From 1991 to 1997, he was a Member of the Technical Staff at Texas Instruments. From 1997 to 2003 and again from 2006 to 2017, he was with TSMC where he led the development of its lithography processes and the development of EUV lithography, including its mask technology, for high-volume manufacturing. Tony has over 100 publications and 150 US patents on nanolithography. He is a Fellow of SPIE and a recipient of its Frits Zernike Award for Microlithography. He is also a recipient of the Outstanding Electrical and Computer Engineer Award from Purdue and co-leads Purdue's Semiconductor Degrees Leadership Board. He serves on the Industrial Advisory Committee of the United States Department of Commerce.
Publications (62)

SPIE Journal Paper | 30 May 2024
Anthony Yen, Weimin Gao
JM3, Vol. 23, Issue 02, 020501, (May 2024) https://doi.org/10.1117/12.10.1117/1.JMM.23.2.020501
KEYWORDS: Light sources and illumination, Printing, Refractive index, Semiconducting wafers, Wafer level optics, Tantalum, Photomasks, Image analysis, Boron nitride, Reflection

SPIE Journal Paper | 1 November 2023
JM3, Vol. 22, Issue 04, 040501, (November 2023) https://doi.org/10.1117/12.10.1117/1.JMM.22.4.040501
KEYWORDS: Photoresist materials, Image resolution, Electric fields, Absorption, Extreme ultraviolet, Reflection, Standing waves, Lithography, Light absorption, Refraction

SPIE Press Book | 19 October 2023
KEYWORDS: Diffraction, Geometrical optics, Spherical lenses, Diffraction gratings, Imaging systems, Microscopes, Image acquisition, Image resolution, Beryllium, Optical spheres

SPIE Journal Paper | 18 May 2023
JM3, Vol. 22, Issue 02, 020501, (May 2023) https://doi.org/10.1117/12.10.1117/1.JMM.22.2.020501
KEYWORDS: 3D image processing, Nanoimprint lithography, Diffraction gratings, Imaging systems, Diffraction, 3D mask effects, Point spread functions, Logic, Light sources and illumination, Integrated circuits

SPIE Journal Paper | 27 October 2022
JM3, Vol. 21, Issue 04, 040501, (October 2022) https://doi.org/10.1117/12.10.1117/1.JMM.21.4.040501
KEYWORDS: Projection lithography, Point spread functions, 3D image processing, Paraxial approximations, Lithography, Photomasks, Imaging systems, Image resolution, Extreme ultraviolet lithography, Wavefronts

Showing 5 of 62 publications
Proceedings Volume Editor (4)

SPIE Conference Volume | 8 December 2009

SPIE Conference Volume | 4 December 2008

SPIE Conference Volume | 26 June 2003

SPIE Conference Volume | 30 July 2002

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