CuY2Ti4O12 (CYTO) crystalline ceramic was successfully prepared through semi-wet route. The phase formation of CYTO ceramic was confirmed by powder X-ray diffraction studies with minor secondary phases formation of Y2O3 and Cu2Ti2O5. In the higher frequency section, the dielectric permittivity and tangent loss are temperature independent, whereas in the lower frequency section, these properties are temperature dependent. The dielectric constant of CYTO was determined as 1.2 x 104 at 100 Hz and 500 K. The dielectric loss of CYTO ceramic was found 0.75 at 10 kHz and 423 K. The dielectric constant and tangent loss both reduce with rising frequency in the lower frequency regions, while these are almost constant in the higher frequency regions. Impedance properties were used to check the grain and grain boundary phenomena in this ceramic. The presence of temperature dependent Maxwell-Wagner type relaxation was established by Impedance investigation of CYTO ceramic.
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