Ariane L. Beck
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 25 October 2006 Paper
Ariane Beck, Xiangyi Guo, Han-Din Liu, Aruna Ghatak-roy, Joe Campbell
Proceedings Volume 6372, 63720O (2006) https://doi.org/10.1117/12.685417
KEYWORDS: Silicon carbide, Avalanche photodetectors, Single photon, Avalanche photodiodes, Ultraviolet radiation, Photon counting, Photons, External quantum efficiency, Biological detection systems, Quenching (fluorescence)

Proceedings Article | 14 August 2003 Open Access Paper
Joe Campbell, Shuling Wang, Xiaoguang Zheng, Xiaowei Li, Ning Li, Feng Ma, Xiaoguang Sun, Charles Collins, A. Beck, B. Yang, Jeffrey Hurst, Rubin Sidhu, Archie Holmes, U. Chowdhury, Michael Wong, Russell Dupuis, Andrew Huntington, Larry Coldren, Zhonghui Chen, Eui-Tae Kim, Anupam Madhukar
Proceedings Volume 5246, (2003) https://doi.org/10.1117/12.511201
KEYWORDS: Avalanche photodetectors, Aluminum, Gallium, Photodetectors, Photodiodes, Gallium arsenide, Ionization, Electrons, Ultraviolet radiation, Quantum dots

Proceedings Article | 1 July 2003 Paper
Joe Campbell, Shuling Wang, Xiaoguang Zheng, Xiaowei Li, Ning Li, Feng Ma, Xiaoguang Sun, Charles Collins, A. Beck, B. Yang, Jeffrey Hurst, Rubin Sidhu, Archie Holmes, U. Chowdhury, Michael Wong, Russell Dupuis, Andrew Huntington, Larry Coldren, Zhonghui Chen, Eui-Tae Kim, Anupam Madhukar
Proceedings Volume 4999, (2003) https://doi.org/10.1117/12.482483
KEYWORDS: Avalanche photodetectors, Photodetectors, Ionization, Electrons, Quantum dots, Ultraviolet radiation, Resistance, External quantum efficiency, Avalanche photodiodes, Indium arsenide

Proceedings Article | 26 October 2000 Paper
Joe Campbell, Ting Li, Shuling Wang, Ariane Beck, Charles Collins, Bo Yang, Damien Lambert, Russell Dupuis, John Carrano, Matthew Schurman, Ian Ferguson
Proceedings Volume 4134, (2000) https://doi.org/10.1117/12.405335
KEYWORDS: Ultraviolet radiation, Gallium nitride, Photodetectors, Photodiodes, Quantum efficiency, Resistance, PIN photodiodes, External quantum efficiency, Aluminum, Diodes

Proceedings Article | 13 April 2000 Paper
Ting Li, Shuling Wang, Ariane Beck, Charles Collins, Bo Yang, Russell Dupuis, John Carrano, Matthew Schurman, Ian Ferguson, Joe Campbell
Proceedings Volume 3948, (2000) https://doi.org/10.1117/12.382131
KEYWORDS: Quantum efficiency, Gallium nitride, Ultraviolet radiation, Photodetectors, Heterojunctions, Photodiodes, Raster graphics, Reactive ion etching, External quantum efficiency, PIN photodiodes

Showing 5 of 6 publications
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