Dr. Arjun Kar-Roy Profile

Dr. Arjun Kar-Roy

Technical Director at Tower Semiconductor USA Inc

SPIE Involvement:

Conference Program Committee | Author | Science Fair Judge

Proceedings Article | 26 May 2020 Paper

High density integrated isolated deep silicon vias in silicon for 3D-ROIC FPA architectures

Arjun Kar-Roy, Yasir Qamar, Sangki Hong, Robert Patti

Proceedings Volume 11407, 114070E (2020) https://doi.org/10.1117/12.2558890

KEYWORDS: Semiconducting wafers, Readout integrated circuits, Analog electronics, Oxides, Silicon, Wafer bonding, Copper

Read Abstract +

Proceedings Article | 26 September 2013 Paper

Performance of buried channel n-type MOSFETs in 0.18-μm CMOS image sensor process

Zhige Zhang, Chris Damerell, David Burt, Arjun Kar-Roy, Konstantin Stefanov

Proceedings Volume 8859, 88590I (2013) https://doi.org/10.1117/12.2024192

KEYWORDS: Transistors, Field effect transistors, Charge-coupled devices, Interfaces, Image processing, CMOS sensors, Semiconductors, Copper indium disulfide, CCD image sensors, Manufacturing

Read Abstract +

Proceedings Article | 31 May 2013 Paper

Recent developments using TowerJazz SiGe BiCMOS platform for mmWave and THz applications

Arjun Kar-Roy, David Howard, Edward Preisler, Marco Racanelli

Proceedings Volume 8715, 871505 (2013) https://doi.org/10.1117/12.1518475

KEYWORDS: Silicon, Receivers, Antennas, Dynamic signature verification, Semiconducting wafers, Imaging arrays, Reticles, Fourier transforms, Metals, Field effect transistors

Read Abstract +

Proceedings Article | 24 October 2012 Paper

Lifetime evaluation of CMOS mixed signal devices

J. Furlong, N. Malone, D. Madajian, A. Kar-Roy, A. Linder

Proceedings Volume 8511, 85110Y (2012) https://doi.org/10.1117/12.964388

KEYWORDS: Failure analysis, Reliability, Metals, Accelerated life testing, Integrated circuits, Sensors, Packaging, Readout integrated circuits, Signal processing, Statistical analysis

Read Abstract +

Proceedings Article | 31 May 2012 Paper

Commercially developed mixed-signal CMOS process features for application in advanced ROICs in 0.18µm technology node

Yasir Qamar, David Howard, Samir Chaudhry, Richard Mann, Robert Zwingman, Paul Hurwitz, Arjun Kar-Roy, Marco Racanelli

Proceedings Volume 8353, 83531P (2012) https://doi.org/10.1117/12.919566

KEYWORDS: Capacitors, Readout integrated circuits, Field effect transistors, Metals, Oxides, CMOS technology, Capacitance, Molybdenum, Analog electronics, Staring arrays

Read Abstract +

Proceedings Article | 13 October 2011 Paper

270GHz SiGe BiCMOS manufacturing process platform for mmWave applications

Roger Booth, Jie Zheng, Zhixin Yan, Edward Preisler, Samir Chaudhry, Arjun Kar-Roy, George Talor, Marco Racanelli, David Howard

Proceedings Volume 8188, 81880F (2011) https://doi.org/10.1117/12.901659

KEYWORDS: Diodes, Molybdenum, Fourier transforms, Metals, Radar, Resistors, Capacitors, Manufacturing, Signal processing, Capacitance

Read Abstract +

Proceedings Article | 3 November 2010 Paper

Mixed-signal 0.18um CMOS and SiGe BiCMOS foundry technologies for ROIC applications

Mike Scott, Paul Hurwitz, Samir Chaudhry, Scott Jordan, David Howard, Arjun Kar-Roy, Robert Zwingman, Marco Racanelli

Proceedings Volume 7834, 78340R (2010) https://doi.org/10.1117/12.865173

KEYWORDS: Readout integrated circuits, Signal processing, CMOS technology, Oxides, Resistors, Metals, Capacitors, Field effect transistors, Fourier transforms, Digital signal processing

Read Abstract +

Proceedings Article | 20 October 2010 Paper

SiGe BiCMOS manufacturing platform for mmWave applications

David Howard, Volker Blaschke, Samir Chaudhry, Edward Preisler, Marco Racanelli, Arjun Kar-Roy

Proceedings Volume 7837, 783707 (2010) https://doi.org/10.1117/12.865210

KEYWORDS: Metals, Resistors, Statistical modeling, Radar, Silicon, CMOS technology, Transceivers, Computer aided design, Manufacturing, Performance modeling

Read Abstract +

Proceedings Article | 4 May 2010 Paper

Scaling and application of commercial, feature-rich, modular mixed-signal technology platforms for large format ROICs

Arjun Kar-Roy, Marco Racanelli, Tao Zhang, Scott Jordan, William Krieger, David Howard, Mark Bowler, Glenn Miyagi

Proceedings Volume 7660, 76603V (2010) https://doi.org/10.1117/12.850836

KEYWORDS: Metals, Capacitors, Readout integrated circuits, CMOS technology, Resistors, Field effect transistors, Statistical modeling, Cryogenics, Oxides, Analog electronics

Read Abstract +

Showing 5 of 9 publications

Conference Committee Involvement (7)

Infrared Technology and Applications L

21 April 2024 | National Harbor, Maryland, United States

Infrared Technology and Applications XLIX

30 April 2023 | Orlando, Florida, United States

Infrared Technology and Applications XLVIII

3 April 2022 | Orlando, Florida, United States

Infrared Technology and Applications XLVII

12 April 2021 | Online Only, Florida, United States

Infrared Technology and Applications XLVI

27 April 2020 | Online Only, California, United States

Showing 5 of 7 Conference Committees

Keywords/Phrases

Search In:

Publication Years