Dr. Arman Gasparyan
at Nokia Bell Labs
SPIE Involvement:
Author | Instructor
Publications (6)

Proceedings Article | 8 February 2008 Paper
Maria Elina Simon, Rick Papazian, Arman Gasparyan, Vladimir Aksyuk, Harold Dyson, Roland Ryf, Robert Frahm, Susanne Arney, David Ramsey, Flavio Pardo
Proceedings Volume 6888, 68880T (2008) https://doi.org/10.1117/12.770432
KEYWORDS: Spatial light modulators, Adaptive optics, Point spread functions, Microelectromechanical systems, Cameras, Control systems, Electronics, Wavefront sensors, Prototyping, Actuators

Proceedings Article | 16 August 2004 Paper
Proceedings Volume 5455, (2004) https://doi.org/10.1117/12.549111
KEYWORDS: Dielectrics, Electrodes, Microelectromechanical systems, Micromirrors, Reliability, Corrosion, Mirrors, Etching, Packaging, Semiconducting wafers

Proceedings Article | 24 April 2003 Paper
Robert Frahm, L. Gomez, S. Rogers, John Miner, Jungsang Kim, Paul Kolodner, Dennis Greywall, Fred Klemens, J. Weld, Hong Tang, Vladimir Aksyuk, Dan Marom, K. Teffeau, Cristian Bolle, Avi Kornblit, Nagesh Basavanhally, A. Ramirez, C. Pai, Dustin Carr, William Mansfield, H. Chan, Victor Lifton, Ronald Scotti, J. Bower, Yee Low, R. Keller, E. Ferry, Arman Gasparyan, David Ramsey, Joseph Vuillemin, Martin Haueis, H. Soh, Herbert Shea, Susanne Arney, John Gates, M. Simon, J. Taylor, T. Kroupenkine, Flavio Pardo, Jian Liu, Roland Ryf, C. Randy Giles, Warren Lai, Mark Paczkowski, David Neilson, Suresh Goyal, H. Bair, David Bishop, Raymond Cirelli, Gregory Bogart
Proceedings Volume 5116, (2003) https://doi.org/10.1117/12.499075
KEYWORDS: Mirrors, Electrodes, Silicon, Microelectromechanical systems, Switches, Reflectors, Semiconducting wafers, Microopto electromechanical systems, Oxides, Optical fabrication equipment

Proceedings Article | 2 October 2001 Paper
Flavio Pardo, C. Randy Giles, Arman Gasparyan, Susanne Arney, David Bishop, Herbert Shea, Vladimir Aksyuk, Cristian Bolle, Robert Frahm, Suresh Goyal, Michael Lin, Carolyn White
Proceedings Volume 4558, (2001) https://doi.org/10.1117/12.442996
KEYWORDS: Microopto electromechanical systems, Reliability, Microelectromechanical systems, Packaging, Telecommunications, Networks, Silicon, Physics, Mechanical engineering, Feedback loops

Proceedings Article | 10 August 2000 Paper
Proceedings Volume 4180, (2000) https://doi.org/10.1117/12.395696
KEYWORDS: Micromirrors, Mirrors, Reliability, Microelectromechanical systems, Doppler effect, Electrodes, Motion measurement, Signal detection, Switching, Interferometry

Showing 5 of 6 publications
Course Instructor
SC434: Designing MEMS for Reliability
This course will provide attendees with a basic working knowledge of how to design MEMS for reliability. The course will concentrate on MEMS design, reliability physics, MEMS-specific fundamental reliability phenomena and failure modes, and accelerated testing protocols. Practical and useful examples from various arenas of MEMS application will be provided.
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