Dr. Arman Gasparyan
at Nokia Bell Labs
SPIE Involvement:
Author | Instructor
Publications (6)

Proceedings Article | 8 February 2008 Paper
Harold Dyson, Flavio Pardo, Roland Ryf, Vladimir Aksyuk, Robert Frahm, Arman Gasparyan, Rick Papazian, David Ramsey, Maria Elina Simon, Susanne Arney
Proceedings Volume 6888, 68880T (2008) https://doi.org/10.1117/12.770432
KEYWORDS: Spatial light modulators, Adaptive optics, Point spread functions, Microelectromechanical systems, Cameras, Control systems, Electronics, Wavefront sensors, Prototyping, Actuators

Proceedings Article | 16 August 2004 Paper
Proceedings Volume 5455, (2004) https://doi.org/10.1117/12.549111
KEYWORDS: Dielectrics, Electrodes, Microelectromechanical systems, Micromirrors, Reliability, Corrosion, Mirrors, Etching, Packaging, Semiconducting wafers

Proceedings Article | 24 April 2003 Paper
Flavio Pardo, Vladimir Aksyuk, Susanne Arney, H. Bair, Nagesh Basavanhally, David Bishop, Gregory Bogart, Cristian Bolle, J. Bower, Dustin Carr, H. Chan, Raymond Cirelli, E. Ferry, Robert Frahm, Arman Gasparyan, John Gates, C. Randy Giles, L. Gomez, Suresh Goyal, Dennis Greywall, Martin Haueis, R. Keller, Jungsang Kim, Fred Klemens, Paul Kolodner, Avi Kornblit, T. Kroupenkine, Warren Lai, Victor Lifton, Jian Liu, Yee Low, William Mansfield, Dan Marom, John Miner, David Neilson, Mark Paczkowski, C. Pai, A. Ramirez, David Ramsey, S. Rogers, Roland Ryf, Ronald Scotti, Herbert Shea, M. Simon, H. Soh, Hong Tang, J. Taylor, K. Teffeau, Joseph Vuillemin, J. Weld
Proceedings Volume 5116, (2003) https://doi.org/10.1117/12.499075
KEYWORDS: Mirrors, Electrodes, Silicon, Microelectromechanical systems, Switches, Reflectors, Semiconducting wafers, Microopto electromechanical systems, Oxides, Optical fabrication equipment

Proceedings Article | 2 October 2001 Paper
Susanne Arney, Vladimir Aksyuk, David Bishop, Cristian Bolle, Robert Frahm, Arman Gasparyan, C. Randy Giles, Suresh Goyal, Flavio Pardo, Herbert Shea, Michael Lin, Carolyn White
Proceedings Volume 4558, (2001) https://doi.org/10.1117/12.442996
KEYWORDS: Microopto electromechanical systems, Reliability, Microelectromechanical systems, Packaging, Telecommunications, Networks, Silicon, Physics, Mechanical engineering, Feedback loops

Proceedings Article | 10 August 2000 Paper
Proceedings Volume 4180, (2000) https://doi.org/10.1117/12.395696
KEYWORDS: Micromirrors, Mirrors, Reliability, Microelectromechanical systems, Doppler effect, Electrodes, Motion measurement, Signal detection, Switching, Interferometry

Showing 5 of 6 publications
Course Instructor
SC434: Designing MEMS for Reliability
This course will provide attendees with a basic working knowledge of how to design MEMS for reliability. The course will concentrate on MEMS design, reliability physics, MEMS-specific fundamental reliability phenomena and failure modes, and accelerated testing protocols. Practical and useful examples from various arenas of MEMS application will be provided.
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