We outline the design of a test stand for characterization of optical sensors intended for use in astronomical applications, and we report the current state of the setup. Once completed, the system will be capable of measuring the performance of charge-coupled devices, complementary metaloxidesemiconductor, and prospective new sensors or cameras equipped with such sensors. The setup vacuum chamber will provide a stable environment for the device under test and allow for cooling down to cryogenic temperatures. The optical system will provide flexibility for the illumination of the sensor—the wavelength and duration can be precisely controlled; flat-field, spot, or patterns can by applied.