Dr. Arnout C. Ruifrok
at Netherlands Forensic Institute
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 8 August 2003 Paper
Proceedings Volume 5108, (2003) https://doi.org/10.1117/12.501151
KEYWORDS: Biometrics, Forensic science, Patents, Silicon, Standards development, Manufacturing, Control systems, Buildings, Iris recognition, Computer security

Proceedings Article | 8 August 2003 Paper
Arnout Ruifrok, Mirelle Goos, Bart Hoogeboom, Derk Vrijdag, Jurrien Bijhold
Proceedings Volume 5108, (2003) https://doi.org/10.1117/12.499806
KEYWORDS: 3D image processing, Cameras, 3D scanning, Head, 3D modeling, Photography, Laser systems engineering, 3D acquisition, Laser applications, Distance measurement

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