Dr. Ashit Talukder
Professor, Director of Charlotte Viz Ctr at The Univ. of North Carolina at Charlotte
SPIE Involvement:
Author
Publications (32)

Proceedings Article | 1 May 2017 Paper
Proc. SPIE. 10203, Pattern Recognition and Tracking XXVIII
KEYWORDS: Infrared detectors, Thermography, Infrared imaging, Weapons, Databases, Video, Feature extraction, Video surveillance, Infrared radiation, Motion models

Proceedings Article | 27 April 2010 Paper
Proc. SPIE. 7671, Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense
KEYWORDS: Radar, Signal to noise ratio, Reflectors, Mirrors, Imaging systems, Signal attenuation, Signal processing, Terahertz radiation, Beam shaping, Radar imaging

Proceedings Article | 5 May 2009 Paper
Proc. SPIE. 7333, Unattended Ground, Sea, and Air Sensor Technologies and Applications XI
KEYWORDS: Environmental monitoring, Data modeling, Sensors, Control systems, Sensor networks, Sensing systems, Optimization (mathematics), Environmental sensing, Systems modeling, Process modeling

Proceedings Article | 13 April 2009 Paper
Proc. SPIE. 7340, Optical Pattern Recognition XX
KEYWORDS: Code division multiplexing, Data mining, Data modeling, Sensors, Satellites, Temporal resolution, Mining, Motion models, Filtering (signal processing), Data fusion

Proceedings Article | 17 March 2008 Paper
Proc. SPIE. 6977, Optical Pattern Recognition XIX
KEYWORDS: Environmental monitoring, Sensors, Control systems, Computer programming, Sensor networks, Wireless communications, Environmental sensing, Systems modeling, Process modeling, Device simulation

Showing 5 of 32 publications
Conference Committee Involvement (17)
Pattern Recognition and Tracking XXXI
27 April 2020 | Online Only, California, United States
Pattern Recognition and Tracking XXX
15 April 2019 | Baltimore, Maryland, United States
Pattern Recognition and Tracking XXIX
18 April 2018 | Orlando, Florida, United States
Pattern Recognition and Tracking XXVIII
12 April 2017 | Anaheim, California, United States
Optical Pattern Recognition XXVII
20 April 2016 | Baltimore, Maryland, United States
Showing 5 of 17 Conference Committees
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