Bastian C. Vauth
at Technische Univ München
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 September 2020 Presentation + Paper
Proc. SPIE. 11537, Electro-Optical and Infrared Systems: Technology and Applications XVII
KEYWORDS: Signal to noise ratio, Mid-IR, Mirrors, Light sources, FT-IR spectroscopy, Spectroscopy, Fourier transforms, Spectral resolution, Time resolved spectroscopy, Fourier optics

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