Dr. Benjamin D. Buckner
SPIE Involvement:
Author
Area of Expertise:
schlieren imaging , light scattering , digital holography , camera calibration
Publications (16)

Proceedings Article | 3 September 2019 Presentation + Paper
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Imaging systems, Lenses, Cameras, Calibration, Image processing, Distortion, Digital imaging, Projection systems, Schlieren techniques

Proceedings Article | 6 September 2017 Presentation + Paper
Proc. SPIE. 10410, Unconventional and Indirect Imaging, Image Reconstruction, and Wavefront Sensing 2017
KEYWORDS: Optical sensors, Wavefront sensors, Wavefronts, Distortion, Rayleigh scattering, Wavefront distortions, Aerodynamics

Proceedings Article | 23 August 2017 Presentation + Paper
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Mirrors, Visualization, Imaging systems, Lenses, Cameras, Calibration, Collimation, Thermal effects, Convection, Aerodynamics

Proceedings Article | 1 September 2015 Paper
Proc. SPIE. 9576, Applied Advanced Optical Metrology Solutions
KEYWORDS: Optical filters, Refractive index, Light sources, Light emitting diodes, Visualization, Imaging systems, Cameras, Image processing, Computing systems, Digital imaging

Proceedings Article | 1 September 2015 Paper
Proc. SPIE. 9576, Applied Advanced Optical Metrology Solutions
KEYWORDS: Optical filters, Imaging systems, Cameras, Calibration, Distortion, Modulators, LCDs, Projection systems, Convection, Analog electronics

Showing 5 of 16 publications
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