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Ben Gable
Component Product Manager
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Publications (1)
Proceedings Article | 7 February 2009 Paper
New developments in 850 and 1300nm VCSELs at JDSU
Luke Graham, Melinda Schnoes, Kevin Maranowski, Thomas Fanning, Max Crom, Stewart Feld, Matthew Gray, Karen Bowers, Steve Silva, Kirk Cook, Gayle Schomberger, Ben Gable
Proceedings Volume 7229, 72290B (2009) https://doi.org/10.1117/12.809649
KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Reliability, Photomasks, Transceivers, Temperature metrology, Oxides, Failure analysis, Wafer-level optics, Standards development
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