Prof. Benito Canales-Pacheco Profile

Prof. Benito Canales-Pacheco

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Publications (4)

Proceedings Article | 18 August 2018 Paper

Interferometric measurements of phase objects by using a simultaneous polarizing phase shifting Mach-Zehnder interferometer

Luis Garcia-Lechuga, Benito Canales-Pacheco, German Resendiz-Lopez, Jose Manuel Sausedo Solorio, Angel Monzalvo-Hernandez, Juan-Manuel Islas-Islas, Areli Montes-Perez, David I. Serrano-García, Jose Gabriel Ortega Mendoza, Marco Escobar-Acevedo, Noel Ivan Toto-Arellano

Proceedings Volume 10749, 107491C (2018) https://doi.org/10.1117/12.2322762

KEYWORDS: Polarization, Phase measurement, Interferometry, Phase shifting, Interferometers, Mach-Zehnder interferometers, Phase shifts, Wave plates, Phase interferometry

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Proceedings Article | 18 August 2018 Paper

Analysis of the local defects of a concave spherical surface using three measurement techniques

B. Canales-Pacheco, Noel Ivan Toto Arellano, León Felipe Austria-González, Raymundo Sergio Noriega-Loredo, A. Cornejo-Rodríguez

Proceedings Volume 10749, 1074919 (2018) https://doi.org/10.1117/12.2320668

KEYWORDS: Spherical lenses, Mirrors, Interferometers, Software, Interferometry, Reflectivity, Optical testing, Metals, Fizeau interferometers, Geometrical optics

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Proceedings Article | 25 September 2012 Paper

Point diffraction interferometer for measurement of the refraction index of a glass plate

E. Rueda-Soriano, F. S. Granados-Agustín, A. Cornejo-Rodríguez, Elizabeth Percino-Zacarías, P. Cebrian-Xochihuila, B. Canales Pacheco

Proceedings Volume 8494, 84940J (2012) https://doi.org/10.1117/12.928889

KEYWORDS: Glasses, Refractive index, Point diffraction interferometers, Wavefronts, Helium neon lasers, Spatial filters, Refraction, Interferometers, CCD cameras, Calibration

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Proceedings Article | 13 September 2012 Paper

Interferometer inspection of local defect type Young-Chalmers

Benito Canales-Pacheco, Alejandro Cornejo-Rodriguez, Fermín Granados-Agustin, Esteban Rueda-Soriano, Pedro Cebrian-Xochihuila

Proceedings Volume 8494, 84940O (2012) https://doi.org/10.1117/12.930049

KEYWORDS: Interferometers, Interferometry, Light sources, Reflectivity, Defect inspection, Inspection, CCD cameras, Spatial light modulators, Optical testing, Spherical lenses

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