Benjamin A. Park
at Univ of Western Australia
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 May 2006 Paper
Proceedings Volume 6206, 62062G (2006) https://doi.org/10.1117/12.664872
KEYWORDS: Plasma, Reactive ion etching, Mercury cadmium telluride, Etching, Argon, Ions, Temperature metrology, Photodiodes, Mercury, Plasma etching

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