Beomjun Park
at Korea University
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 September 2019 Presentation
Proceedings Volume 11114, 1111403 (2019) https://doi.org/10.1117/12.2531675
KEYWORDS: Annealing, Tellurium, Transmission electron microscopy, Cadmium, Sensors, Backscatter

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