Berkcan Gökçe
R&D Engineer at imec
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | 17 October 2016
Evert Ebraert, Berkcan Gökçe, Sandra Van Vlierberghe, Michael Vervaeke, Pascal Meyer, Markus Guttmann, Peter Dubruel, Hugo Thienpont, Jürgen Van Erps
JM3, Vol. 15, Issue 04, 044501, (October 2016) https://doi.org/10.1117/12.10.1117/1.JMM.15.4.044501
KEYWORDS: Polymethylmethacrylate, Rapid manufacturing, Surface roughness, Prototyping, Photomasks, Nickel, Optical alignment, Single mode fibers, Connectors, Etching

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