An experiment using 4f system model is designed to test the consistency of the units on the FPA , which is made based
on MEMS technology. An optical stop as a filter is set at the back focal plane of the first lens. We get each image where
the light source locates when it is rotated round FPA. The size of the stop and the rotating angle can be deduced
according to the parameters of two lens. Meanwhile reflectance spectrum of each unit on the FPA can be drawn with the
gray level of the image presented by CCD. Contourgraph is used to test the displacement deflection value caused by
thermal deformation of FPA. According to the displacement deflection value and the unit size of FPA, we get the
average deflection angle of FPA's units when temperature changes per centigrade degree. We can define a gray level
difference of two adjacent images at the same position as M. When we let the value of M larger than a number N, we can
say that the system has met the requirement of temperature sensitivity-T. With the help of M, light rotating angle and
FPA's deflection angle, we can get the temperature sensitivity of the IR system. The actual value of temperature
sensitivity approximates the NETD of the system. The calculating process proves that it can estimate the NETD, if we
don't want to get the accurate value of NETD. The expression of T is much easier and more feasible than that of NETD.
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