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Biyu Zhao
at Univ of Electronic Science and Technology of China
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Publications (5)
SPIE Journal Paper | 29 June 2016
Flexible global calibration technique for an arbitrarily arranged fringe projection profilometry system
OE, Vol. 55, Issue 06, 064113, (June 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.6.064113
KEYWORDS: Calibration, Cameras, Imaging systems, Projection systems, Distortion, Optical engineering, Fringe analysis, Zirconium, Lithium, Mathematical modeling
SPIE Journal Paper | 7 April 2015
Simultaneous and signal-to-noise ratio enhancement extraction of vibration location and frequency information in phase-sensitive optical time domain reflectometry distributed sensing system
OE, Vol. 54, Issue 04, 047101, (April 2015) https://doi.org/10.1117/12.10.1117/1.OE.54.4.047101
KEYWORDS: Signal to noise ratio, Backscatter, Fourier transforms, Spatial resolution, Sensing systems, Reflectometry, Signal processing, Ferroelectric materials, Data acquisition, Interference (communication)
Proceedings Article | 18 September 2014 Paper
Accuracy enhancement of three-dimensional surface shape measurement using curvelet transform
Proceedings Volume 9282, 92820D (2014) https://doi.org/10.1117/12.2068418
KEYWORDS: Denoising, Wavelet transforms, Fringe analysis, 3D image processing, Fourier transforms, 3D metrology, Image processing, Image analysis, Image denoising, Projection systems
Proceedings Article | 18 September 2014 Paper
High-accuracy inspection of defects and profile of wafers by phase measuring deflectometry
Proceedings Volume 9282, 928208 (2014) https://doi.org/10.1117/12.2067887
KEYWORDS: Semiconducting wafers, Inspection, Wafer inspection, Defect inspection, Deflectometry, Spatial resolution, Fringe analysis, Phase shift keying, Photovoltaics, Defect detection
Proceedings Article | 22 June 2013 Paper
Carrier frequency removal in phase measuring deflectometry with non-telecentric imaging
Huimin Yue, Yuxiang Wu, Lei Song, Biyu Zhao, Zhonghua Ou, Yong Liu
Proceedings Volume 8769, 87691L (2013) https://doi.org/10.1117/12.2018711
KEYWORDS: Fringe analysis, Zernike polynomials, Mirrors, Deflectometry, LCDs, CCD cameras, Error analysis, Computer simulations, Phase shift keying, Complex systems
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