Brajesh Kumar Kaushik received Ph.D. in 2007 from Indian Institute of Technology, Roorkee, India. He is serving as full Professor at IIT Roorkee. He had been Visiting Professor at TU-Dortmund, Germany in 2017; McGill University, Canada in 2018 and Liaocheng University, China in 2018. He served as Visiting Lecturer of SPIE society to deliver lectures in the area of Spintronics and Optics at SPIE chapters located across the world. He also served as Chairman and Vice Chairman of IEEE Roorkee sub-section. Dr. Kaushik is a Senior Member of IEEE and member of many expert committees constituted by government and non-government organizations. He is currently serving as Distinguished Lecturer (DL) of IEEE Electron Devices Society (EDS) to offer EDS Chapters with quality lectures in his research domain. He is Editor-in-Chief of Elsevier Journal, Memories-Materials, Devices, Circuits and Systems; an Editor of IEEE Transactions on Electron Devices; Associate Editor of IEEE Sensors Journal; Associate Editor of IET Circuits, Devices & Systems; Editor of Microelectronics Journal, Elsevier; and Editorial Board member of Circuit World, Emerald. He is among top 2% scientists in world as per Stanford University report of 2019. He has 12 books to his credit published by reputed publishers such as CRC Press, Springer, Artech and Elsevier. One his books, titled “Nanoscale Devices: Physics, Modeling, and Their Application”, CRC Press won 2018 Outstanding Book and Digital Product Awards from Taylor and Francis Group. He has been offered with fellowships and awards from DAAD, Shastri Indo Canadian Institute (SICI), ASEM Duo, United States-India Educational Foundation (Fulbright-Nehru Academic and Professional Excellence). His research interests are in the areas of high-speed interconnects, carbon nanotube-based designs, organic electronics, device circuit co-design, optics & photonics-based devices, image processing, spintronics-based devices, circuits and computing.
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The performance evaluation of infrared (IR) imaging systems plays a vital role prior to effective deployment. The minimum resolvable temperature difference (MRTD) is the primary key parameter of an IR imaging system, because it describes the overall system performance including that of a human operator. MRTD defines the minimum temperature difference required to resolve the four-bar target of defined spatial frequencies and is used to estimate the recognition ranges of a thermal imaging system before deployment for field evaluation. Conventionally, MRTD measurements use the temperature difference of a four-bar target that is exposed to the minimum resolvable condition. In current practice, subjective MRTD measurement employs a human operator to observe the minimum resolvable condition and therefore suffers from poor repeatability. It is a tedious procedure to evaluate large numbers of thermal imaging sights during production. In this work, an accurate objective MRTD measurement method is described by measuring the modulation transfer function and the noise equivalent temperature difference (NETD) of the thermal imager. Experiments were carried out to measure both subjective and objective MRTD. The results of the subjective and objective MRTD measurements are presented along with a comparison of the results. It is observed that the percentage error in objective MRTD is very close to that from a conventional subjective MRTD measurement.
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