Mr. Brian Ashe Profile

Brian Ashe

Program Manager at MKS Instruments Inc

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Author

Publications (7)

Proceedings Article | 17 July 2010 Paper

Fully digital image sensor employing delta-sigma indirect feedback ADC with high-sensitivity to low-light illuminations for astronomical imaging applications

Danijel Maricic, Zeljko Ignjatovic, Donald Figer, Brian Ashe, Brandon Hanold, Thomas Montagliano, Don Stauffer, Shouleh Nikzad

Proceedings Volume 7742, 774217 (2010) https://doi.org/10.1117/12.857391

KEYWORDS: Image sensors, Photodiodes, Transistors, Cadmium sulfide, CMOS sensors, Prototyping, Signal to noise ratio, Astronomical imaging, Sensors, Imaging systems

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Proceedings Article | 16 July 2010 Paper

Characterization of a Σ∆-based CMOS monolithic detector

Brandon Hanold, Donald Figer, Brian Ashe, Thomas Montagliano, Donald Stauffer, Zeljko Ignjatovic, Danijel Maricic, Shouleh Nikzad, Todd Jones

Proceedings Volume 7742, 77420A (2010) https://doi.org/10.1117/12.857176

KEYWORDS: Sensors, Photodiodes, Capacitance, Quantum efficiency, Analog electronics, CMOS sensors, Electronics, Silicon, Modulation, Etching

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Proceedings Article | 13 July 2010 Paper

Hybridization of a sigma-delta-based CMOS hybrid detector

K. Kolb, N. Stoffel, B. Douglas, C. Maloney, A. Raisanen, B. Ashe, D. Figer, T. Tamagawa, B. Halpern, Zeljko Ignjatovic

Proceedings Volume 7742, 77420C (2010) https://doi.org/10.1117/12.857510

KEYWORDS: Metals, Polymers, Indium, Sensors, Photodiodes, Readout integrated circuits, Photoresist processing, Etching, Semiconducting wafers, CMOS sensors

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Proceedings Article | 29 August 2008 Paper

Minimizing contamination to multilayer dielectric diffraction gratings within a large vacuum system

B. Ashe, K. Marshall, D. Mastrosimone, C. McAtee

Proceedings Volume 7069, 706902 (2008) https://doi.org/10.1117/12.792581

KEYWORDS: Diffraction gratings, Laser damage threshold, Contamination, Ultrasonics, Picosecond phenomena, Spectroscopy, Laser systems engineering, Diffraction, Dielectrics, Pulsed laser operation

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Proceedings Article | 20 December 2007 Paper

Optimizing a cleaning process for multilayer dielectric (MLD) diffraction gratings

B. Ashe, C. Giacofei, G. Myhre, A. Schmid

Proceedings Volume 6720, 67200N (2007) https://doi.org/10.1117/12.751750

KEYWORDS: Diffraction gratings, Laser damage threshold, Photoresist materials, Scanning electron microscopy, Picosecond phenomena, Ions, Statistical analysis, Fusion energy, Contamination, Laser systems engineering

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Proceedings Article | 21 September 2007 Paper

Vapor-phase-deposited organosilane coatings as hardening agents for high-peak-power laser optics

K. Marshall, Z. Culakova, B. Ashe, C. Giacofei, A. Rigatti, T. Kessler, A. Schmid, J. Oliver, A. Kozlov

Proceedings Volume 6674, 667407 (2007) https://doi.org/10.1117/12.734723

KEYWORDS: Laser damage threshold, Head-mounted displays, Silicon, Diffraction gratings, Natural surfaces, Resistance, Water, Laser systems engineering, Glasses, Optical coatings

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Proceedings Article | 15 January 2007 Paper

Evaluation of cleaning methods for multilayer diffraction gratings

B. Ashe, K. Marshall, C. Giacofei, A. Rigatti, T. Kessler, A. Schmid, J. Oliver, J. Keck, A. Kozlov

Proceedings Volume 6403, 64030O (2007) https://doi.org/10.1117/12.694884

KEYWORDS: Diffraction gratings, Ions, Diffraction, Silicon, Laser damage threshold, Scanning electron microscopy, Contamination, Photoresist materials, Silicon carbide, Laser systems engineering

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Showing 5 of 7 publications

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