Dr. Brian Piccione
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 28 May 2020 Open Access Paper
Xudong Jiang, Samuel Wilton, Igor Kudryashov, Mark Itzler, Mark Entwistle, Jack Kotelnikov, Alexei Katsnelson, Brian Piccione, Mark Owens, Krystyna Slomkowski, Scott Roszko, Sabbir Rangwala
Proceedings Volume 10729, 107290P (2020) https://doi.org/10.1117/12.2574715
KEYWORDS: LIDAR, Artificial intelligence, Optical sensing, Optical imaging, Photon counting, X-ray imaging, X-rays, Terahertz radiation, X-ray optics, Photonics

Proceedings Article | 18 September 2018 Presentation + Paper
Xudong Jiang, Samuel Wilton, Igor Kudryashov, Mark Itzler, Mark Entwistle, Jack Kotelnikov, Alexei Katsnelson, Brian Piccione, Mark Owens, Krys Slomkowski, Scott Roszko, Sabbir Rangwala
Proceedings Volume 10729, 107290C (2018) https://doi.org/10.1117/12.2322757
KEYWORDS: LIDAR, Sensors, 3D image processing, Staring arrays, Short wave infrared radiation, Cameras, Single photon, Imaging systems, Spatial resolution, Semiconductor lasers

Proceedings Article | 9 June 2017 Presentation
Mark Itzler, Gennaro Salzano, Mark Entwistle, Xudong Jiang, Mark Owens, Brian Piccione, Sam Wilton, Krystyna Slomkowski, Scott Roszko, Esther Wei
Proceedings Volume 10212, 102120K (2017) https://doi.org/10.1117/12.2264573
KEYWORDS: LIDAR, Cameras, Avalanche photodiodes, Single photon detectors, Avalanche photodetectors, 3D acquisition, 3D image processing, 3D metrology, Stereoscopy, Free space optical communications

Proceedings Article | 13 May 2015 Paper
Quan Chau, Xudong Jiang, Mark Itzler, Mark Entwistle, Brian Piccione, Mark Owens, Krystyna Slomkowski
Proceedings Volume 9492, 94920O (2015) https://doi.org/10.1117/12.2177082
KEYWORDS: Staring arrays, Cameras, Reflection, Solids, Readout integrated circuits, Avalanche photodiodes, LIDAR, 3D image processing, Personal digital assistants, Avalanche photodetectors

Proceedings Article | 9 May 2005 Paper
Proceedings Volume 5768, (2005) https://doi.org/10.1117/12.598871
KEYWORDS: Atomic force microscopy, Glasses, Liquids, Imaging systems, Atomic force microscope, Finite element methods, Computer simulations, Transmittance, Ultrasonics, Silicon

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