Brian J. Ritter
at Advanced Optical Technologies
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 March 2019 Presentation + Paper
Brian Hoover, Jonathan Turner, Brian Ritter, Joseph Michael, Michael Uchic
Proceedings Volume 10750, 107500D (2019) https://doi.org/10.1117/12.2321601
KEYWORDS: Crystals, Polarimetry, Surface finishing, Crystallography, Titanium, Surface roughness, Polishing, Microscopy, Metals, Spatial resolution

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top