Dr. Brian J. Simonds
at National Institute of Standards and Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (9)

Proceedings Article | 8 March 2019 Presentation
Proc. SPIE. 10911, High-Power Laser Materials Processing: Applications, Diagnostics, and Systems VIII
KEYWORDS: Coherence imaging, Coherence (optics), Metals, Image processing, Video, Laser welding, Interferometry, Transition metals, Additive manufacturing, Video processing

Proceedings Article | 18 March 2016 Paper
Proc. SPIE. 9741, High-Power Laser Materials Processing: Lasers, Beam Delivery, Diagnostics, and Applications V
KEYWORDS: Mirrors, Metrology, Radio optics, Calibration, High power lasers, Reflectivity, Laser welding, Photodiodes, Head, Radiometry, Laser metrology, Laser manufacturing, Laser optics, Optics manufacturing, Power meters, Prototyping

Proceedings Article | 14 March 2016 Paper
Proc. SPIE. 9735, Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XXI
KEYWORDS: Thin films, Photovoltaics, Glasses, Silicon, Diffusion, Laser processing, Silicon films, Silicon solar cells, Semiconducting wafers

SPIE Journal Paper | 19 January 2015
JPE Vol. 5 Issue 01
KEYWORDS: Annealing, Laser processing, Thin films, Photovoltaics, Selenium, Thin film solar cells, Crystals, Chalcogenides, Solar cells, Pulsed laser operation

Proceedings Article | 8 October 2014 Paper
Proc. SPIE. 9180, Laser Processing and Fabrication for Solar, Displays, and Optoelectronic Devices III
KEYWORDS: Thin films, Photovoltaics, Continuous wave operation, Spectroscopy, Annealing, High power lasers, Solar cells, Laser processing, Optical testing, Absorption

Showing 5 of 9 publications
Conference Committee Involvement (3)
Dimensional Optical Metrology and Inspection for Practical Applications X
11 April 2021 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications IX
27 April 2020 | Online Only, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications VIII
16 April 2019 | Baltimore, Maryland, United States
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