Dr. Brian L. Stamper
Associate Principal Scientist at Nikon Research Corp of America
SPIE Involvement:
Publications (8)

Proceedings Article | 18 August 2005 Paper
Proc. SPIE. 5869, Optical Manufacturing and Testing VI
KEYWORDS: Monochromatic aberrations, Metrology, Spatial frequencies, Fourier transforms, Wavefronts, Data processing, Zernike polynomials, Mathematics, Picosecond phenomena, Inverse optics

Proceedings Article | 22 December 2003 Paper
Proc. SPIE. 5180, Optical Manufacturing and Testing V
KEYWORDS: Refractive index, Glasses, Image processing, Error analysis, Interferometry, Optical testing, Tomography, 3D metrology, Computed tomography, Optics manufacturing

Proceedings Article | 23 December 2002 Paper
Proc. SPIE. 4832, International Optical Design Conference 2002
KEYWORDS: Lithography, Refractive index, Statistical analysis, Imaging systems, Spatial frequencies, Glasses, 3D modeling, Geometrical optics, Chemical elements, Systems modeling

Proceedings Article | 18 December 2002 Paper
Proc. SPIE. 4849, Highly Innovative Space Telescope Concepts
KEYWORDS: Actuators, Telescopes, Mirrors, Electrodes, Image segmentation, Wavefronts, Control systems, Space telescopes, Space mirrors

Proceedings Article | 27 December 2001 Paper
Proc. SPIE. 4451, Optical Manufacturing and Testing IV
KEYWORDS: Actuators, Monochromatic aberrations, Telescopes, Mirrors, Polishing, Electrodes, Pellicles, Space telescopes, Epoxies, Lightweight mirrors

Showing 5 of 8 publications
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