The design of robust Adaptive Optics systems (AO) requires to characterize spatially and temporally
the aberrations. Thus, it is of importance to have an instrument able to measure the aberrations at
high spatial and temporal resolutions. The high spatial resolution is necessary to have an extended
modal decomposition of aberrations, to characterize finely the pupil irradiance and to quantify
aliasing and fitting errors. The high temporal resolution is necessary to analyze the evolution of
very fast phenomena contributing in the aberration dynamics, e.g. fast pupil movements, tear film
and accommodation. Because, Hardware constraints make it difficult to obtain high spatial and
temporal resolutions on a single detector, we have designed a new aberrometer comprising two
synchronized instruments, one highly spatially resolved, the second one highly temporally resolved
that allows to perform such measurements. Preliminary results have been obtained on the highly
spatially resolved instrument. The integration of the second instrument is in progress. An overview
of the first instrument results is presented in this paper.
Neglecting pupil irradiance fluctuations using a Hartmann Shack wavefront sensor leads to phase reconstruction bias. This bias depends on the pupil irradiance profile, the Hartmann Shack geometry and the
amplitude and structure of the aberrations. In order to quantify the impact on real eye aberrations measurement, pupil irradiance and ocular aberrations of three trained subjects have been acquired on the LESIA testbed at Hospital des Quinze-Vingts. The pure WFS error is quantified with these data sets, on various
lenslet array geometries. The propagation of this pure WFS error on actual systems, namely a static aberro-
meter and an AO imager, is addressed. We find that, for a large enough lenslet array and with a reasonably
clean optical path, the induced error is negligible.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.