Dr. Zewei Cai
Postdoctoral fellow at Shenzhen Univ
SPIE Involvement:
Publications (12)

Proceedings Article | 17 April 2020 Paper
Proc. SPIE. 11455, Sixth Symposium on Novel Optoelectronic Detection Technology and Applications
KEYWORDS: 3D acquisition, Calibration, Remote sensing, Clouds, 3D modeling, Image registration, Photogrammetry, Machine vision, 3D scanning, 3D image processing

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11438, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology
KEYWORDS: Modulation, Imaging systems, Phase shift keying, 3D modeling, 3D metrology, Projection systems, Structured light

Proceedings Article | 18 November 2019 Paper
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Metrology, Microlens array, Cameras, Sensors, Calibration, Image processing, Optical testing, Image sensors, Signal detection, 3D image processing

Proceedings Article | 3 September 2019 Paper
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Modulation, Imaging systems, Cameras, Calibration, Computer programming, 3D modeling, 3D metrology, Microlens, 3D image processing, Phase shifts

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: 3D image reconstruction, Imaging systems, Cameras, Calibration, 3D metrology

Showing 5 of 12 publications
  • View contact details

Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top