Dr. Cameron M. Kewish Profile

Dr. Cameron M. Kewish

Research Fellow at Australian Synchrotron

SPIE Involvement:

Author

Proceedings Article | 26 September 2013 Paper

High efficiency x-ray nanofocusing by the blazed stacking of binary zone plates

I. Mohacsi, P. Karvinen, I. Vartiainen, A. Diaz, A. Somogyi, C. Kewish, P. Mercere, C. David

Proc. SPIE. 8851, X-Ray Nanoimaging: Instruments and Methods

KEYWORDS: Actuators, Diffraction, Lenses, X-rays, Scanning electron microscopy, Optical alignment, Zone plates, Binary data, Phase shifts, Near field optics

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Proceedings Article | 26 September 2013 Paper

Status of the Nanoscopium scanning nanoprobe beamline of Synchrotron Soleil

A. Somogyi, K. Medjoubi, C. Kewish, V. Leroux, M. Ribbens, G. Baranton, F. Polack, J. Samama

Proc. SPIE. 8851, X-Ray Nanoimaging: Instruments and Methods

KEYWORDS: Coherence imaging, Mirrors, Mechanics, Imaging systems, X-rays, Nanoprobes, Synchrotrons, Spatial resolution, Monochromators, X-ray imaging

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Proceedings Article | 26 September 2013 Paper

Design optimization of ultra-precise elliptical mirrors for hard x-ray nanofocusing at Nanoscopium

Cameron Kewish, François Polack, Riccardo Signorato, Andrea Somogyi

Proc. SPIE. 8851, X-Ray Nanoimaging: Instruments and Methods

KEYWORDS: Diffraction, Point spread functions, Mirrors, X-ray optics, Metrology, X-rays, Reflectivity, Nanoprobes, Tolerancing, Hard x-rays

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Proceedings Article | 28 September 2011 Paper

Characterization of a 20-nm hard x-ray focus by ptychographic coherent diffractive imaging

Joan Vila-Comamala, Ana Diaz, Manuel Guizar-Sicairos, Sergey Gorelick, Vitaliy Guzenko, Petri Karvinen, Cameron Kewish, Elina Färm, Mikko Ritala, Alexandre Mantion, Oliver Bunk, Andreas Menzel, Christian David

Proc. SPIE. 8139, Advances in X-Ray/EUV Optics and Components VI

KEYWORDS: Electron beam lithography, Coherence imaging, X-ray optics, X-rays, X-ray diffraction, Reconstruction algorithms, Spatial resolution, Zone plates, Hard x-rays, Iridium

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Proceedings Article | 13 May 2010 Paper

Refractive x-ray optics made from polymer microstructures

M. Simon, V. Nazmov, E. Reznikova, A. Last, J. Mohr, P.-J. Jakobs, V. Saile, O. Bunk, C. Kewish, D. Batchelor, R. Simon

Proc. SPIE. 7716, Micro-Optics 2010

KEYWORDS: Prisms, X-ray optics, Lenses, Polymers, X-rays, X-ray microscopy, X-ray imaging, X-ray lithography, Photorefractive polymers, Synchrotron technology

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Proceedings Article | 22 May 2009 Paper

Advanced methods in scanning x-ray microscopy

A. Menzel, M. Dierolf, C. Kewish, P. Thibault, K. Jefimovs, C. David, M. Bech, T. Jensen, R. Feidenhans'l, A.-M. Heegaard, R. Hansen, T. Berthing, K. Martinez, J. Als-Nielsen, S. Kapishnikov, L. Leiserowitz, F. Pfeiffer, O. Bunk

Proc. SPIE. 7378, Scanning Microscopy 2009

KEYWORDS: Coherence imaging, Phase contrast, Scattering, Sensors, Microscopy, X-rays, X-ray microscopy, Light scattering, X-ray imaging, Optics manufacturing

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Proceedings Article | 5 September 2008 Paper

Advances in ptychographical coherent diffractive imaging

Andreas Menzel, Pierre Thibault, Martin Dierolf, Cameron Kewish, Oliver Bunk, Christian David, Wolfram Leitenberger, Franz Pfeiffer

Proc. SPIE. 7076, Image Reconstruction from Incomplete Data V

KEYWORDS: Diffraction, Coherence imaging, X-ray optics, Sensors, X-rays, X-ray microscopy, Phase retrieval, Deconvolution, Image retrieval, Reconstruction algorithms

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