Carlos Alberto Galván-Hernández
Nanoscience and Nanotechnology Researcher at Ctr Nacional de Metrologia
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 November 2003 Paper
Proceedings Volume 5190, (2003) https://doi.org/10.1117/12.503865
KEYWORDS: Calibration, Image processing, CCD cameras, Refractive index, Interferometers, Microscopes, Control systems, Image filtering, Interferometry, Software development

Proceedings Article | 29 July 2002 Paper
Proceedings Volume 4900, (2002) https://doi.org/10.1117/12.484529
KEYWORDS: Fringe analysis, Calibration, Interferometers, Data modeling, Metrology, Interferometry, Standards development, Laser metrology, Edge detection, Error analysis

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