Chao Zou
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 November 2007 Paper
Chao Zou, Li Xiao, Bingwen Wang
Proceedings Volume 6788, 67880Q (2007) https://doi.org/10.1117/12.748056
KEYWORDS: Defect detection, Detection and tracking algorithms, Stochastic processes, Statistical analysis, Computer architecture, Statistical modeling, Visualization, Fractal analysis, Wavelets, Analytical research

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