Charles Belzile
Product Line Manager at ABB Analytical Measurement
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 22 April 2010 Paper
Proceedings Volume 7662, 766212 (2010) https://doi.org/10.1117/12.850560
KEYWORDS: Calibration, Infrared cameras, Cameras, Black bodies, Sensors, Temperature metrology, Staring arrays, Data acquisition, Infrared radiation, Infrared imaging

Proceedings Article | 15 October 2004 Paper
Proceedings Volume 5546, (2004) https://doi.org/10.1117/12.567741
KEYWORDS: Interferometers, Staring arrays, Imaging systems, Sensors, Black bodies, Spectrometers, Imaging spectroscopy, Fourier transforms, Modulation, Temperature metrology

Proceedings Article | 13 August 2004 Paper
Proceedings Volume 5416, (2004) https://doi.org/10.1117/12.565033
KEYWORDS: Interferometers, Sensors, Staring arrays, Spectroscopy, Calibration, Black bodies, Cameras, Control systems, Data acquisition, Imaging systems

Proceedings Article | 30 March 2004 Paper
Charles Belzile, Marie-Christine Belanger, Alain Viau, Martin Chamberland, Simon Roy
Proceedings Volume 5271, (2004) https://doi.org/10.1117/12.519183
KEYWORDS: Luminescence, Fluorometers, Light sources, Signal detection, Sensors, Lamps, Imaging systems, Global Positioning System, Ultraviolet radiation, Linear filtering

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