Dr. Chen Li
at Zhejiang Univ
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 24 July 2018 Paper
Proceedings Volume 10827, 108271B (2018) https://doi.org/10.1117/12.2500384
KEYWORDS: Image compression, Defect detection, Metals, Detection and tracking algorithms, Image enhancement, Visualization, Image processing, Image filtering, Image segmentation, Corrosion

Proceedings Article | 24 November 2016 Paper
Fan Wu, Pin Cao, Yongying Yang, Chen Li, Huiting Chai, Yihui Zhang, Haoliang Xiong, Wenlin Xu, Kai Yan, Lin Zhou, Dong Liu, Jian Bai, Yibing Shen
Proceedings Volume 10023, 100230T (2016) https://doi.org/10.1117/12.2245891
KEYWORDS: Distortion, Inspection, Defect inspection, Standards development, Imaging systems, Scattering, Optical components, Image processing, Microscopes, Optical inspection

Proceedings Article | 24 November 2016 Paper
Huiting Chai, Pin Cao, Yongying Yang, Chen Li, Fan Wu, Yihui Zhang, Haoliang Xiong, Lin Zhou, Kai Yan, Wenlin Xu, Dong Liu, Jian Bai, Yibing Shen
Proceedings Volume 10023, 100230L (2016) https://doi.org/10.1117/12.2245430
KEYWORDS: Light scattering, Electromagnetic scattering, Scattering, Finite-difference time-domain method, Imaging systems, Diffraction, Inspection, Calibration, Electromagnetism, Electron beam lithography

Proceedings Article | 28 October 2016 Paper
Haoliang Xiong, Yongying Yang, Chen Li, Huiting Chai, Wenlin Xv, Kai Yan, Lin Zhou, Yang Li, Yihui Zhang, Dong Liu, Jian Bai, Yibing Shen, Pin Cao
Proceedings Volume 9683, 96831U (2016) https://doi.org/10.1117/12.2243267
KEYWORDS: Error analysis, Spherical lenses, Defect detection, Monte Carlo methods, Imaging systems, Ions, Statistical analysis, Optical components, Charge-coupled devices, Matrices

Proceedings Article | 6 March 2015 Paper
Chen Li, Yongying Yang, Pin Cao, Shitong Wang, Dong Liu, Lu Li, Lu Yan, Yang Li, Shibing Xie, Yangjie Chen
Proceedings Volume 9446, 94462S (2015) https://doi.org/10.1117/12.2181189
KEYWORDS: Image segmentation, Detection and tracking algorithms, Image processing algorithms and systems, Hough transforms, Imaging systems, Microscopes, Image processing, Scattering, Defect detection, Light scattering

Showing 5 of 6 publications
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