Christian Dahmen
at Carl von Ossietzky Univ Oldenburg
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 15 November 2011 Paper
T. Wortmann, C. Dahmen, S. Fatikow
Proceedings Volume 8335, 83351J (2011) https://doi.org/10.1117/12.917420
KEYWORDS: Scanning electron microscopy, Image processing, Object recognition, Detection and tracking algorithms, Nanorobotics, Sensors, Robotics, Control systems, Image sensors, Electron microscopes

Proceedings Article | 17 November 2008 Paper
Proceedings Volume 7266, 72660X (2008) https://doi.org/10.1117/12.807090
KEYWORDS: Cameras, Actuators, Sensors, Scanning electron microscopy, Detection and tracking algorithms, Computer programming, Imaging systems, Image processing, Prototyping, Visualization

Proceedings Article | 17 November 2008 Paper
Proceedings Volume 7266, 72661O (2008) https://doi.org/10.1117/12.807274
KEYWORDS: Scanning electron microscopy, Detection and tracking algorithms, Distance measurement, Calibration, Electron microscopes, Image processing, Image segmentation, Nanomanipulation, Electron beams, Cameras

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