Prof. Christian Faber
at Hochschule für Angewandte Wissenschaften
SPIE Involvement:
Area of Expertise:
Optical Metrology , Sensor Technology , Image Processing , Automated Optical Inspection (AOI) , Phase Measuring Deflectometry (PMD) , Industrial Statistics
Publications (5)

Proceedings Article | 21 August 2020 Presentation + Paper
Proc. SPIE. 11510, Applications of Digital Image Processing XLIII
KEYWORDS: Fringe analysis, Wavelet transforms, Cameras, Wavelets, Deflectometry, Phase shifts

Proceedings Article | 3 September 2019 Paper
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Mirrors, Deflectometry, 3D metrology

Proceedings Article | 13 May 2013 Paper
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Mirrors, Eye, Optical spheres, Cameras, Calibration, Glasses, Manufacturing, Interferometry, Deflectometry, Aspheric lenses

Proceedings Article | 13 September 2012 Paper
Proc. SPIE. 8493, Interferometry XVI: Techniques and Analysis
KEYWORDS: Point spread functions, Mirrors, Light sources, Reflection, Spatial frequencies, Calibration, Interferometry, Computer programming, Deflectometry, Signal processing

Proceedings Article | 27 May 2011 Paper
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Signal to noise ratio, Microscopes, Fringe analysis, Speckle, Sensors, Microscopy, Inspection, Data acquisition, 3D metrology, Objectives

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