Mr. Christian Frey Profile

Christian Frey

at RWTH Aachen Univ

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 12 March 2024 Presentation + Paper

Johannes Wahl, Christian Frey, John Powell, Felix Zaiß, Michael Haas, Simon Olschok, Christian Hagenlocher, Uwe Reisgen, Thomas Graf

Proceedings Volume 12878, 1287809 (2024) https://doi.org/10.1117/12.3002720

KEYWORDS: Optical testing, Laser welding, Laser processing, Image processing, Measurement devices

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases